ANGULAR DEPENDENT PHOTOELECTRIC YIELD AND OPTICAL-CONSTANTS OF AL BETWEEN 40 AND 600 EV

被引：21

作者：

BIRKEN, HG ^{[1
]}

JARK, W ^{[1
]}

KUNZ, C ^{[1
]}

WOLF, R ^{[1
]}

机构：

[1] DESY,HASYLAB,D-2000 HAMBURG 52,FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1986年 / 253卷 / 01期

关键词：

D O I：

10.1016/0168-9002(86)91141-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：166 / 170

页数：5

共 9 条

[1] OPTICAL PROPERTIES AND ELECTRON-ATTENUATION LENGTHS FROM PHOTOELECTRIC YIELD MEASUREMENTS [J].

ARAKAWA, ET ;

HAMM, RN ;

WILLIAMS, MW .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1973, 63 (09) :1131-1134

[2]

ARAKAWA ET, 1974, 4TH P INT C VUV RAD, P580

[3] ATTENUATION LENGTH FOR PHOTOELECTRONS EXCITED IN ALUMINUM BY 21.2-EV PHOTONS [J].

GESELL, TF ;

ARAKAWA, ET .

PHYSICAL REVIEW LETTERS, 1971, 26 (07) :377-&

[4]

HAGEMANN HJ, 1975, J OPT SOC AM, V65, P742, DOI 10.1364/JOSA.65.000742

[5] A NEW VUV-REFLECTOMETER FOR UHV-APPLICATIONS [J].

HOGREFE, H ;

GIESENBERG, D ;

HAELBICH, RP ;

KUNZ, C .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3) :415-418

[6]

JARK W, 1986, UNPUB NUCL INSTR MET

[7]

LYNCH DM, 1986, UNPUB HDB SYNCHROTRO, V2

[8] OPTICAL ANALYSIS OF PHOTOEMISSION [J].

PEPPER, SV .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (06) :805-&

[9] SELF-CONSISTENCY AND SUM-RULE TESTS IN THE KRAMERS-KRONIG ANALYSIS OF OPTICAL-DATA - APPLICATIONS TO ALUMINUM [J].

SHILES, E ;

SASAKI, T ;

INOKUTI, M ;

SMITH, DY .

PHYSICAL REVIEW B, 1980, 22 (04) :1612-1628

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