A METHOD OF ANALYZING THE INDUCED CURRENT PROFILES OBTAINED ON A SCHOTTKY DIODE AT NORMAL IRRADIATION

被引：7

作者：

DONOLATO, C

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1984年 / 31卷 / 01期

关键词：

D O I：

10.1109/T-ED.1984.21485

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：121 / 123

页数：3

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