PHOTOACOUSTIC MICROSCOPIC (PAM) IMAGES OF SOME GAAS WAFERS

被引：7

作者：

KASAI, M ^{[1
]}

SAWADA, T ^{[1
]}

GOHSHI, Y ^{[1
]}

机构：

[1] UNIV TOKYO,FAC ENGN,DEPT IND CHEM,7-3-1 HONG,BUNKYO KU,TOKYO 113,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1985年 / 24卷

关键词：

D O I：

10.7567/JJAPS.24S1.220

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：220 / 221

页数：2

共 9 条

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[3]

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[6] THERMAL-WAVE DEPTH PROFILING - THEORY [J].

OPSAL, J ;

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[7] THERMAL WAVE MICROSCOPY WITH PHOTO-ACOUSTICS [J].

ROSENCWAIG, A .

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[8]

ROSENCWAIG A, 1982, SOLID STATE TECHNOL, V25, P91

[9]

Shimizu H., 1984, Journal of the Spectroscopical Society of Japan, V33, P249, DOI 10.5111/bunkou.33.249

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