ESTIMATION OF THICKNESS, COMPLEX BULK PERMITTIVITY AND SURFACE CONDUCTIVITY USING INTERDIGITAL DIELECTROMETRY

被引：27

作者：

ZARETSKY, MC ^{[1
]}

LI, P ^{[1
]}

MELCHER, JR ^{[1
]}

机构：

[1] MIT,ELECTROMAGNET & ELECTR SYST LAB,CAMBRIDGE,MA 02139

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1989年 / 24卷 / 06期

关键词：

D O I：

10.1109/14.46350

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1159 / 1166

页数：8

共 13 条

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[9]

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[10] CONTINUUM PROPERTIES FROM INTERDIGITAL ELECTRODE DIELECTROMETRY [J].

ZARETSKY, MC ;

MOUAYAD, L ;

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IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1988, 23 (06) :897-917

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