IMAGING IN SCANNING MICROSCOPES WITH SLIT-SHAPED DETECTORS

被引：34

作者：

WILSON, T

HEWLETT, SJ

机构：

[1] Department of Engineering Science, University of Oxford, Oxford, OX1 3PJ, Parks Road

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1990年 / 160卷

关键词：

confocal design; confocal systems; image formation; Scanning microscopy;

D O I：

10.1111/j.1365-2818.1990.tb03053.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We consider the imaging in scanning microscopes employing point and slit‐shaped detectors in both the bright‐field and fluorescent mode. In particular we consider the three‐dimensional aspects of the imaging and show inter alia that acceptable, albeit asymmetrical, images result from a slit detector system at low levels of defocus. The situation becomes worse as the defocus is increased although acceptable extended‐focus and isometric images are still possible in some cases. 1990 Blackwell Science Ltd

引用

页码：115 / 139

页数：25

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