TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF NYLONS - DETECTION OF HIGH MASS FRAGMENTS

被引：80

作者：

BLETSOS, IV

HERCULES, DM

GREIFENDORF, D

BENNINGHOVEN, A

机构：

[1] UNIV PITTSBURGH,DEPT CHEM,PITTSBURGH,PA 15260

[2] UNIV MUNSTER,INST PHYS,D-4400 MUNSTER,FED REP GER

来源：

ANALYTICAL CHEMISTRY | 1985年 / 57卷 / 12期

关键词：

D O I：

10.1021/ac00289a049

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2384 / 2388

页数：5

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