QUANTITATIVE DEPTH PROFILING OF BIPOROUS NICKEL ELECTRODES BY FREQUENCY-DOMAIN LASER-INDUCED PHOTOACOUSTIC-SPECTROSCOPY

被引：14

作者：

MANDELIS, A

LYMER, JD

机构：

[1] Univ of Toronto, Photoacoustics Lab,, Toronto, Ont, Can, Univ of Toronto, Photoacoustics Lab, Toronto, Ont, Can

来源：

APPLIED SPECTROSCOPY | 1985年 / 39卷 / 03期

关键词：

D O I：

10.1366/0003702854248476

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：473 / 480

页数：8

共 19 条

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