ONLINE ACQUISITION AND ANALYSIS FOR HOLOGRAPHIC NON-DESTRUCTIVE EVALUATION

[1] Dandliker R., 1973, Optics Communications, V9, P412, DOI 10.1016/0030-4018(73)90284-8

[2] Erf R., 1974, HOLOGRAPHIC NONDESTR

[3] PHOTOCONDUCTOR-THERMOPLASTIC DEVICES FOR HOLOGRAPHIC NON-DESTRUCTIVE TESTING [J]. OPTICAL ENGINEERING, 1980, 19 (05) : 659 - 665

[4] Lee T. C., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V215, P192

[5] Roark R. J., 1965, FORMULAS STRESS STRA

[6] SHARPE RS, 1973, RES TECHNIQUES NONDE, V2

[7] HOLOGRAPHY APPLIED TO STRUCTURAL COMPONENTS [J]. OPTICAL ENGINEERING, 1975, 14 (05) : 460 - 469

[8] STRAINS FROM HOLOGRAPHIC DATA [J]. EXPERIMENTAL MECHANICS, 1978, 18 (06) : 208 - 214

[9] DOUBLE-EXPOSURE HOLOGRAPHIC-INTERFEROMETRY USING COMMON-PATH REFERENCE WAVES [J]. APPLIED OPTICS, 1977, 16 (06) : 1736 - 1741

[1] Dandliker R., 1973, Optics Communications, V9, P412, DOI 10.1016/0030-4018(73)90284-8

[2] Erf R., 1974, HOLOGRAPHIC NONDESTR

[3] PHOTOCONDUCTOR-THERMOPLASTIC DEVICES FOR HOLOGRAPHIC NON-DESTRUCTIVE TESTING [J]. OPTICAL ENGINEERING, 1980, 19 (05) : 659 - 665

[4] Lee T. C., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V215, P192

[5] Roark R. J., 1965, FORMULAS STRESS STRA

[6] SHARPE RS, 1973, RES TECHNIQUES NONDE, V2

[7] HOLOGRAPHY APPLIED TO STRUCTURAL COMPONENTS [J]. OPTICAL ENGINEERING, 1975, 14 (05) : 460 - 469

[8] STRAINS FROM HOLOGRAPHIC DATA [J]. EXPERIMENTAL MECHANICS, 1978, 18 (06) : 208 - 214

[9] DOUBLE-EXPOSURE HOLOGRAPHIC-INTERFEROMETRY USING COMMON-PATH REFERENCE WAVES [J]. APPLIED OPTICS, 1977, 16 (06) : 1736 - 1741