A STRUCTURAL STUDY OF CO-SB MULTILAYERED FILM BY X-RAY-DIFFRACTION

被引：14

作者：

NAKAYAMA, N ^{[1
]}

TAKAHASHI, K ^{[1
]}

SHINJO, T ^{[1
]}

TAKADA, T ^{[1
]}

ICHINOSE, H ^{[1
]}

机构：

[1] UNIV TOKYO ROPPINGI,INST IND SCI,TOKYO 106,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1986年 / 25卷 / 04期

关键词：

D O I：

10.1143/JJAP.25.552

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：552 / 557

页数：6

共 8 条

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[8] LAYERED SYNTHETIC MICROSTRUCTURES AS BRAGG DIFFRACTORS FOR X-RAYS AND EXTREME ULTRAVIOLET - THEORY AND PREDICTED PERFORMANCE [J].

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APPLIED OPTICS, 1981, 20 (17) :3027-3034

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