NEW VALUES FOR SILICON REFERENCE MATERIALS, CERTIFIED FOR ISOTOPE ABUNDANCE RATIOS

被引：11

作者：

DEBIEVRE, P ^{[1
]}

VALKIERS, S ^{[1
]}

PESIER, HS ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL, GAITHERSBURG, MD 20899 USA

来源：

JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | 1994年 / 99卷 / 02期

关键词：

ABSOLUTE ABUNDANCES; ATOMIC WEIGHTS; CYCLOTRON FREQUENCIES; ISOTOPE ABUNDANCES; ISOTOPE RATIO MASS SPECTROMETRY; ISOTOPE REFERENCE MATERIALS; PENNING TRAP; RELATIVE ATOMIC MASSES; REFERENCE MATERIAL; SILICON; SILICON TETRAFLUORIDE;

D O I：

10.6028/jres.099.016

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

New isotope abundance and relative atomic mass (atomic weight) values-with low, hitherto unattained uncertainty-are reported for two previously described silicon reference materials using a well-known method with an improved isotope-ratio mass spectrometer. These new values are directly traceable to the SI, more specifically to the unit for amount of substance, the mole, and independent of the SI unit of mass and of the Avogadro constant. Besides the residual mass-spectrometric uncertainties, these new values depend in effect only on a recently published direct comparison of the cyclotron frequency in a Penning trap of Si-28+ with that of C-12+.

引用

页码：201 / 202

页数：2

共 8 条

[1] THE 1993 ATOMIC MASS EVALUATION .1. ATOMIC MASS TABLE [J].

AUDI, G ;

WAPSTRA, AH .

NUCLEAR PHYSICS A, 1993, 565 (01) :1-65

[2] ABSOLUTE ISOTOPIC ABUNDANCE RATIOS AND ATOMIC WEIGHT OF A REFERENCE SAMPLE OF SILICON [J].

BARNES, IL ;

MOORE, LJ ;

MACHLAN, LA ;

MURPHY, TJ ;

SHIELDS, WR .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1975, 79 (06) :727-735

[3]

DEBIEVRE P, 1994, IN PRESS

[4] DIRECT DETERMINATION OF THE MASS OF SI-28 AS A CONTRIBUTION TO A NEW DEFINITION OF THE KILOGRAM [J].

JERTZ, R ;

BECK, D ;

BOLLEN, G ;

EMMES, J ;

KLUGE, HJ ;

SCHARK, E ;

SCHWARZ, S ;

SCHWARZ, T ;

SCHWEIKHARD, L ;

SENNE, P ;

CARLBERG, C ;

BERGSTROM, I ;

BORGENSTRAND, H ;

ROULEAU, G ;

SCHUCH, R ;

SODERBERG, F .

PHYSICA SCRIPTA, 1993, 48 (04) :399-404

[5]

SCHAFER F, 1994, IN PRESS INT J MASS

[6]

SEYFRIED P, 1992, Z PHYS B CON MAT, V87, P289, DOI 10.1007/BF01309282

[7] SILICON REFERENCE MATERIALS CERTIFIED FOR ISOTOPE ABUNDANCES [J].

VALKIERS, S ;

DEBIEVRE, P ;

LENAERS, G ;

PEISER, HS .

JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 1991, 96 (05) :617-619

[8]

VALKIERS S, IRMM GERMS1189 INT R

← 1 →