PHOTOREFLECTANCE OF GAAS/GAALAS MULTIPLE QUANTUM-WELLS - TOPOGRAPHICAL VARIATIONS IN BARRIER HEIGHT AND WELL WIDTH

被引：45

作者：

PARAYANTHAL, P

SHEN, H

POLLAK, FH

GLEMBOCKI, OJ

SHANABROOK, BV

BEARD, WT

机构：

[1] CUNY,GRAD SCH & CTR,DEPT PHYS,NEW YORK,NY 10036

[2] USN,RES LAB,WASHINGTON,DC 20375

来源：

APPLIED PHYSICS LETTERS | 1986年 / 48卷 / 19期

关键词：

D O I：

10.1063/1.96997

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1261 / 1263

页数：3

共 18 条

[1] MEASUREMENTS OF ELECTRIC-FIELD-INDUCED ENERGY-LEVEL SHIFTS IN GAAS SINGLE-QUANTUM-WELLS USING ELECTROREFLECTANCE [J].

ALIBERT, C ;

GAILLARD, S ;

BRUM, JA ;

BASTARD, G ;

FRIJLINK, P ;

ERMAN, M .

SOLID STATE COMMUNICATIONS, 1985, 53 (05) :457-460

[2]

Aspnes D. E., 1980, Handbook on semiconductors, vol.II. Optical properties of solids, P109

[3] SUPER-LATTICE BAND-STRUCTURE IN THE ENVELOPE-FUNCTION APPROXIMATION [J].

BASTARD, G .

PHYSICAL REVIEW B, 1981, 24 (10) :5693-5697

[4] THEORETICAL INVESTIGATIONS OF SUPER-LATTICE BAND-STRUCTURE IN THE ENVELOPE-FUNCTION APPROXIMATION [J].

BASTARD, G .

PHYSICAL REVIEW B, 1982, 25 (12) :7584-7597

[5]

BASTARD G, 1985, SUPERLATTICE MICROST, V7, P265

[6]

DAWSON P, 1985, SUPERLATT MICROSTRUC, V1, P321

[7] ELECTRONIC STATES AND THICKNESSES OF GAAS/GAALAS QUANTUM WELLS AS MEASURED BY ELECTROREFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY [J].

ERMAN, M ;

THEETEN, JB ;

FRIJLINK, P ;

GAILLARD, S ;

HIA, FJ ;

ALIBERT, C .

JOURNAL OF APPLIED PHYSICS, 1984, 56 (11) :3241-3249

[8]

ESAKI L, 1985, 17TH P INT C PHYS SE, P473

[9]

GLEMBOCKI OJ, 1985, P SOC PHOTO-OPT INST, V524, P86, DOI 10.1117/12.946323

[10] PHOTOREFLECTANCE CHARACTERIZATION OF INTERBAND-TRANSITIONS IN GAAS/ALGAAS MULTIPLE QUANTUM WELLS AND MODULATION-DOPED HETEROJUNCTIONS [J].

GLEMBOCKI, OJ ;

SHANABROOK, BV ;

BOTTKA, N ;

BEARD, WT ;

COMAS, J .

APPLIED PHYSICS LETTERS, 1985, 46 (10) :970-972

← 1 2 →