INSITU STUDIES OF GRAIN-GROWTH IN THIN METAL-FILMS

被引:23
作者
NICHOLS, CS
MANSURI, CM
TOWNSEND, SJ
SMITH, DA
机构
[1] CORNELL UNIV, DEPT PHYS, ITHACA, NY 14853 USA
[2] IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
来源
ACTA METALLURGICA ET MATERIALIA | 1993年 / 41卷 / 06期
关键词
D O I
10.1016/0956-7151(93)90206-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Grain growth in thin films of aluminum has been studied using in situ transmission electron microscopy and a heating stage. Videotapes taken during grain growth were analyzed with the intent of searching for the predominant local rearrangement processes responsible for growth. Evolution of a soap froth can be decomposed into only two elementary local topology rearranging events. We have found numerous exceptions to prevailing theories that compare grain growth in thin films to the evolution of such froths. These observations suggest that a more complete picture of grain growth is necessary and that such a theory must include more complex local rearrangement processes.
引用
收藏
页码:1861 / 1868
页数:8
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