A MODEL OF SAFE LEVELS FOR ELECTRICAL-STIMULATION

被引：351

作者：

SHANNON, RV

机构：

[1] House Ear Institute, Los Angeles

来源：

IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING | 1992年 / 39卷 / 04期

关键词：

D O I：

10.1109/10.126616

中图分类号：

R318 [生物医学工程];

学科分类号：

0831 ;

摘要：

A model is presented that represents a large body of data on safety and damage levels of electrical stimulation. The predictions of the model are consistent with known principles of current flow and known mechanisms of damage around stimulating electrodes. It is proposed that limits on levels of electrical stimulation take into account the location of the electrode relative to the stimulated tissue and these limits can be computed algorithmically from the model.

引用

页码：424 / 426

页数：3

共 6 条

[1]

LEAKE PA, 1990, NEURAL PROSTHESES FU, P253

[2] CHARGE-DENSITY AND CHARGE PER PHASE AS COFACTORS IN NEURAL INJURY INDUCED BY ELECTRICAL-STIMULATION [J].