VALIDITY OF MODEL MICROFIELD METHOD AS APPLIED TO STARK-BROADENING OF NEUTRAL LINES

被引：42

作者：

BRISSAUD, A

GOLDBACH, C

LEORAT, J

MAZURE, A

NOLLEZ, G

机构：

[1] ECOLE NATL SUPER TECH AVANCEES,F-91120 PALAISEAU,FRANCE

[2] INST ASTROPHYS,F-75014 PARIS,FRANCE

[3] ECOLE POLYTECH,CTR PHYS THEORIQUE,F-91120 PALAISEAU,FRANCE

[4] UNIV PARIS 7,F-75005 PARIS,FRANCE

[5] OBSERV PARIS,F-92190 MEUDON,FRANCE

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 1976年 / 9卷 / 07期

关键词：

D O I：

10.1088/0022-3700/9/7/014

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1129 / 1146

页数：18

共 28 条

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[9] APPLICATION OF MODEL MICROFIELD METHOD TO STARK PROFILES OF OVERLAPPING AND ISOLATED NEUTRAL LINES [J].

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MAZURE, A ;

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