DEPENDENCE OF SEMICONDUCTOR-LASER LINEWIDTH ON MEASUREMENT TIME - EVIDENCE OF PREDOMINANCE OF 1/F NOISE

被引：30

作者：

KIKUCHI, K

OKOSHI, T

机构：

来源：

ELECTRONICS LETTERS | 1985年 / 21卷 / 22期

关键词：

D O I：

10.1049/el:19850717

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：1011 / 1012

页数：2

相关论文

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