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AN IMPROVED METHOD OF SELECTING NETWORK TOPOLOGY FOR OPTIMAL TERMINAL RELIABILITY

被引：2
作者：
JAIN, SP
GOPAL, K
机构：
[1] Regional Engineering Coll, Kurukshetra, India, Regional Engineering Coll, Kurukshetra, India
来源：
MICROELECTRONICS AND RELIABILITY | 1986年 / 26卷 / 02期
关键词：
D O I：
10.1016/0026-2714(86)90720-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
ELECTRIC NETWORKS
引用
收藏
页码：255 / 259
页数：5
相关论文
共 6 条
[1]   TOPOLOGICAL LAYOUT OF LINKS FOR OPTIMIZING THE S-T RELIABILITY IN A COMPUTER-COMMUNICATION SYSTEM [J].
AGGARWAL, KK ;
CHOPRA, YC ;
BAJWA, JS .
MICROELECTRONICS AND RELIABILITY, 1982, 22 (03) :341-345
[2]   TOPOLOGICAL LAYOUT OF LINKS FOR OPTIMIZING THE OVERALL RELIABILITY IN A COMPUTER-COMMUNICATION SYSTEM [J].
AGGARWAL, KK ;
CHOPRA, YC ;
BAJWA, JS .
MICROELECTRONICS AND RELIABILITY, 1982, 22 (03) :347-351
[3]   NETWORK TOPOLOGY FOR MAXIMIZING THE TERMINAL RELIABILITY IN A COMPUTER-COMMUNICATION NETWORK [J].
CHOPRA, YC ;
SOHI, BS ;
TIWARI, RK ;
AGGARWAL, KK .
MICROELECTRONICS RELIABILITY, 1984, 24 (05) :911-913
[4]  
DEO N, 1974, GRAPH THEORY APPLICA
[5]   RECURSIVE ALGORITHM FOR RELIABILITY EVALUATION OF K-OUT-OF-N-G SYSTEM [J].
JAIN, SP ;
GOPAL, K .
IEEE TRANSACTIONS ON RELIABILITY, 1985, 34 (02) :144-&
[6]  
Mifsud C.J., 1963, COMMUN ACM, V6, P103
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