NEW HORIZONS IN X-RAY-FLUORESCENCE ANALYSIS

被引：12

作者：

GILFRICH, JV ^{[1
]}

机构：

[1] SACHS FREEMAN ASSOCIATES INC, LANDOVER, MD 20785 USA

来源：

X-RAY SPECTROMETRY | 1990年 / 19卷 / 02期

关键词：

D O I：

10.1002/xrs.1300190204

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Although the present‐day x‐ray analyst has at his or her disposal a sufficient variety of instrumentation and data reduction schemes to enable him or her to perform elemental analysis on many different types of materials, there exists a continuing demand to improve detection limits, to extend the capability to lower atomic numbers and to make the analytical process more efficient (easier!). There are advances in x‐ray physics and instrumentation being pursued which may contribute to these objectives. The status of these efforts is reviewed and some suggestions are made concerning their potential. Copyright © 1990 John Wiley & Sons, Ltd.

引用

页码：45 / 51

页数：7

共 37 条

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ARAI T, 1983, ADV X RAY ANAL, V26, P423

[2]

ARAI T, 1981, COMMUNICATION

[3] SENSITIVE, QUANTITATIVE RECORDING X-RAY SPECTROMETER [J].