MICHELSON INTERFEROMETER FOR DETECTION OF FAST DISPLACEMENTS OF LESS THAN A QUARTER-WAVE OVER SMALL AREAS

被引：5

作者：

KELLER, R ^{[1
]}

SALATHE, R ^{[1
]}

TSCHUDI, T ^{[1
]}

VOUMARD, C ^{[1
]}

机构：

[1] UNIV BERNE,INST APPL PHYS,CH-3012 BERNE,SWITZERLAND

来源：

APPLIED OPTICS | 1975年 / 14卷 / 07期

关键词：

D O I：

10.1364/AO.14.001616

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1616 / 1620

页数：5

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