COMPREHENSIVE, NONINTERCEPTING ELECTRON-BEAM DIAGNOSTICS USING SPONTANEOUS-EMISSION CHARACTERISTICS

被引:11
作者
LUMPKIN, AH
机构
[1] Los Alamos National Laboratory, Physics Division, Los Alamos, NM 87545
关键词
D O I
10.1016/0168-9002(90)91200-U
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Characterization and optimization of electron-beam parameters are important aspects of optimizing free-electron-laser (FEL) performance. The visible spontaneous emission (λ ≈ 650 nm) from the 5 m long undulator of the Boeing FEL experiment can be characterized in sufficient detail with a streak/spectrometer to deduce time-resolved electron-beam spatial position and profile, micropulse duration and energy. © 1990.
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页码:134 / 143
页数:10
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