QUANTITATIVE INORGANIC ANALYSIS BY Q-SWITCHED LASER MASS-SPECTROSCOPY

[1] AHEARN AJ, 1972, TRACE ANAL MASS SPEC

[2] BINGHAM RA, 1976, ANAL CHEM, V48, P1735, DOI 10.1021/ac50006a030

[3] BYKOWSKII YA, 1977, PRIB TEKH EKSP, V2, P163

[4] CAVARD A, 1968, ADV MASS SPECTROM, V4, P419

[5] SCANNING LASER MASS-SPECTROMETER MILLIPROBE [J]. ANALYTICAL CHEMISTRY, 1978, 50 (13) : 1854 - 1860

[6] A REVIEW OF THE APPLICATIONS TO SOLIDS OF THE LASER ION-SOURCE IN MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 197 - 271

[7] DIETZ J, 1972, EXP TECH PHYS, V20, P389

[8] DINGLE T, 1981, J PHYS E, V14, P513

[9] ELOY JF, 1975, 18TH C SPECTR INT GR, V3, P906

[10] HILLENKAMP F, 1980, SCAN ELECTRON MICROS, V2, P597

[1] AHEARN AJ, 1972, TRACE ANAL MASS SPEC

[2] BINGHAM RA, 1976, ANAL CHEM, V48, P1735, DOI 10.1021/ac50006a030

[3] BYKOWSKII YA, 1977, PRIB TEKH EKSP, V2, P163

[4] CAVARD A, 1968, ADV MASS SPECTROM, V4, P419

[5] SCANNING LASER MASS-SPECTROMETER MILLIPROBE [J]. ANALYTICAL CHEMISTRY, 1978, 50 (13) : 1854 - 1860

[6] A REVIEW OF THE APPLICATIONS TO SOLIDS OF THE LASER ION-SOURCE IN MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 197 - 271

[7] DIETZ J, 1972, EXP TECH PHYS, V20, P389

[8] DINGLE T, 1981, J PHYS E, V14, P513

[9] ELOY JF, 1975, 18TH C SPECTR INT GR, V3, P906

[10] HILLENKAMP F, 1980, SCAN ELECTRON MICROS, V2, P597