Application of the ionless tripod polisher to the preparation of YBCO superconducting multilayer and bulk ceramics thin films

被引：57

作者：

Ayache, J ^{[1
]}

Albarede, PH ^{[1
]}

机构：

[1] IBM FRANCE,SERV 1807 31U,F-91105 CORBEIL ESSONNES,FRANCE

来源：

ULTRAMICROSCOPY | 1995年 / 60卷 / 02期

关键词：

D O I：

10.1016/0304-3991(95)00073-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The standard method of polishing using ion milling for cross-section preparation induces atomic diffusion which can be avoided by using an ionless polisher. The present paper gives the details of the method as applied to superconducting YBa2Cu3O7 melt-textured ceramics and multilayer thin films. The structure and chemistry of interfaces in this complex system are known to be influenced by changes in the chemical composition, Because of non-stoichiometry related growth of secondary phases, many secondary phases form. We present a technique, which allows preparation of electron-transparent TEM samples, that can be used for HREM and chemical characterizations.

引用

页码：195 / 206

页数：12

共 5 条

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