SEEMANN-BOHLIN X-RAY DIFFRACTOMETRY .2. COMPARISON OF ABERRATIONS AND INTENSITY WITH CONVENTIONAL DIFFRACTOMETER

被引：16

作者：

MACK, M

PARRISH, W

机构：

来源：

关键词：

D O I：

10.1107/S0365110X67003500

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：693 / &

共 14 条

[1] A TRUE FOCUSING ATTACHMENT FOR X-RAY DIFFRACTOMETER [J].

BAUN, WL ;

RENTON, JJ .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1963, 40 (10) :498-&

[2]

DASGUPTA K, 1966, ADV XRAY ANAL, V9, P221

[3]

DUNNE JA, 1965, 33218 JET PROP LAB T, P129

[4]

KUNZE G, 1964, Z ANGEW PHYS, V18, P28

[5]

KUNZE G, 1964, Z ANGEW PHYS, V17, P522

[6]

KUNZE G, 1964, Z ANGEW PHYS, V17, P412

[7] X-RAY DIFFRACTOMETRY WITH SLIGHTLY ABSORBING SAMPLES [J].

LEVY, HA ;

AGRON, PA ;

DANFORD, MD .

MILBERG, ME .

[9] SEEMANN-BOHLIN X-RAY DIFFRACTOMETRY .I. INSTRUMENTATION [J].

PARRISH, W ;

MACK, M .

[10]

PARRISH W, 1967, NORELCO REPORTER, V14, P56