EPITAXIAL BATIO3 MGO STRUCTURE GROWN ON GAAS(100) BY PULSED-LASER DEPOSITION

被引:53
作者
NASHIMOTO, K [1 ]
FORK, DK [1 ]
PONCE, FA [1 ]
TRAMONTANA, JC [1 ]
机构
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 9B期
关键词
EPITAXIAL BATIO3; BUFFER MGO; GAAS SUBSTRATE; THIN FILM; MICROSTRUCTURE; HYSTERESIS; PULSED LASER DEPOSITION;
D O I
10.1143/JJAP.32.4099
中图分类号
O59 [应用物理学];
学科分类号
摘要
BaTiO3 thin films on MgO encapsulated GaAs(100) were prepared epitaxially, in condition ranging from 600-degrees-C to 800-degrees-C and from 2 x 10(-4) Torr O2 to 1 X 10(-2) Torr O2, by pulsed laser deposition. The epitaxial relationship between all materials was cube-on-cube. BaTiO3 thin films obtained were c axis oriented tetragonal phase and showed ferroelectric properties. EpitaXial BaTiO3 had quite smooth surface of less than 100 angstrom in roughness. BaTiO3 grown on 40-angstrom-thick epitaxial MgO was also epitaxial although defect density in BaTiO3 looked higher than that in BaTiO3 grown on 400-angstrom-thick MgO. The interfaces of BaTiO3/40-angstrom-thick MgO/GaAs structure were abrupt and free of secondary phases in spite of the quite thin MgO layer.
引用
收藏
页码:4099 / 4102
页数:4
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