EFFECTS OF A NON-SYSTEMATIC REFLECTION ON THICKNESS EXTINCTION CONTOURS IN DARK-FIELD IMAGES .1. EXPERIMENTAL RESULTS AND COMPARISON WITH MULTI-BEAM THEORY

被引：2

作者：

CANN, CD ^{[1
]}

SHEININ, SS ^{[1
]}

机构：

[1] UNIV ALBERTA,DEPT PHYS,EDMONTON,ALBERTA,CANADA

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1974年 / 26卷 / 01期

关键词：

D O I：

10.1002/pssa.2210260118

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：193 / 199

页数：7

共 16 条

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[9] SOME ELECTRON DIFFRACTION CONTRAST EFFECTS AT PLANAR DEFECTS IN CRYSTALS [J].

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[10]

IBERS JA, 1962, INT CRYSTALLOGRAPHIC, V3, P237

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