SIMS AND SIMS IMAGING STUDIES OF ADSORBED DIALKYL DITHIOPHOSPHINATES ON PBS CRYSTAL-SURFACES

被引：20

作者：

BRINEN, JS ^{[1
]}

GREENHOUSE, S ^{[1
]}

NAGARAJ, DR ^{[1
]}

LEE, J ^{[1
]}

机构：

[1] CYTEC IND,1937 W MAIN,STAMFORD,CT 06904

来源：

INTERNATIONAL JOURNAL OF MINERAL PROCESSING | 1993年 / 38卷 / 1-2期

关键词：

D O I：

10.1016/0301-7516(93)90067-K

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

Secondary Ion Mass Spectrometry (SIMS) has been used to study the surfaces of natural galena (lead sulfide) crystals treated with a homologous series of dialkyl dithiophosphinates. The semi-quantitative adsorption data, as a function of pH, obtained from the near static SIMS measurements using the fragment ions attributable to the dithiophosphinates are consistent with that expected from actual mineral flotation data. Imaging experiments using reagent fragment ions under non-static SIMS conditions allowed mapping of dithiophosphinate species on crystal faces of plena. Contrary to what might be expected, non-uniform dithiophosphinate adsorption was observed. The very high sensitivity relative to other surface analytical techniques, and the imaging capability of SIMS, make it a valuable tool to study monolayer and submonolayer adsorption of surfactants on solids.

引用

页码：93 / 109

页数：17

共 9 条

[1] STATIC SIMS IMAGING OF THE ADSORPTION OF DIISOBUTYL DITHIOPHOSPHINATE ON GALENA SURFACES [J].