MAGNETIC FORCE MICROSCOPY ANALYSIS OF SOFT THIN-FILM ELEMENTS

被引:35
作者
RAVE, W
BELLIARD, L
LABRUNE, M
THIAVILLE, A
MILTAT, J
机构
[1] Laboratoire de Physique des Solides, Universite Paris Sud - CNRS
关键词
D O I
10.1109/20.334124
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Several different soft magnetic materials have been investigated by means of Magnetic Force Microscopy (MFM) using a commercial Atomic Force Microscope (Nanoscope III) with slope detection. The observed contrast of basically solenoidal magnetization distributions in nanocrystalline Fe-Permalloy multilayer and single-layer Permalloy thin film elements not only reveals wall locations, and thus the subdivision of the magnetic volume into domains, but also a decomposition into subdomains hitherto undocumented. A strong influence of the magnetic fine structure is also demonstrated Additional observations of the classical lancets of a Goss texture in bulk Iron confirm the fact that the symmetries of the observed contrast are consistent with those of the perpendicular component of magnetization within a volume close to the sample surface.
引用
收藏
页码:4473 / 4478
页数:6
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