THE EFFECT OF AMORPHOUS SURFACE-LAYERS ON IMAGES OF CRYSTALS IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：20

作者：

KILAAS, R

GRONSKY, R

机构：

[1] Lawrence Berkeley Lab, Natl Cent for, Electron Microscopy, Berkeley, CA,, USA, Lawrence Berkeley Lab, Natl Cent for Electron Microscopy, Berkeley, CA, USA

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 02期

关键词：

All Open Access; Green;

D O I：

10.1016/0304-3991(85)90073-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

CRYSTALS

引用

页码：193 / 201

页数：9

共 8 条

[1] [Anonymous], COMMUNICATION
[2] ANSTIS GR, 1983, I PHYS C SER, V68, P169
[3] STRUCTURE OF VITREOUS-SILICA - VALIDITY OF RANDOM NETWORK THEORY
BELL, RJ
DEAN, P
[J]. PHILOSOPHICAL MAGAZINE, 1972, 25 (06): : 1381 - &
[4] BOLLMANN W, 1975, CRYSTAL DEFECTS CRYS, P215
[5] BOURRET A, 1981, I PHYS C SER, V60, P9
[6] REAL SPACE IMAGE SIMULATION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
KILAAS, R
GRONSKY, R
[J]. ULTRAMICROSCOPY, 1983, 11 (04) : 289 - 298
[7] KRAKOW W, 1981, I PHYS C SER, V61, P365
[8] MAZUR JH, 1983, I PHYS C SER, V67, P77

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