ALGORITHM COMPARISON FOR HIGH IMPEDANCE FAULT-DETECTION BASED ON STAGED FAULT TEST

被引:42
作者
HUANG, CL
CHU, HY
CHEN, MT
机构
[1] Natl Cheng Kung Univ, Tainan, Taiwan
关键词
D O I
10.1109/61.193941
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
9
引用
收藏
页码:1427 / 1435
页数:9
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