COMPARISON OF THE ICOSAHEDRAL AND ALPHA-STRUCTURES OF AL-MN-SI WITH THE USE OF SOFT-X-RAY EMISSION-SPECTROSCOPY

被引：6

作者：

BRUHWILER, PA

SHEN, Y

SCHNATTERLY, SE

POON, SJ

机构：

来源：

PHYSICAL REVIEW B | 1987年 / 36卷 / 14期

关键词：

D O I：

10.1103/PhysRevB.36.7347

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：7347 / 7352

页数：6

共 35 条

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