USING OPTICAL RAY-TRACING TO EXPLAIN THE REDUCED DYE YIELD OF MICRODENIER YARNS

被引：18

作者：

KOBSA, H

RUBIN, B

SHEARER, SM

SCHULZ, EM

机构：

[1] DUPONT CO INC,EXPT STN,WILMINGTON,DE 19880

[2] DUPONT CO INC,BENGER LAB,WAYNESBORO,VA 22980

来源：

TEXTILE RESEARCH JOURNAL | 1993年 / 63卷 / 08期

关键词：

D O I：

10.1177/004051759306300807

中图分类号：

TB3 [工程材料学]; TS1 [纺织工业、染整工业];

学科分类号：

0805 ; 080502 ; 0821 ;

摘要：

An optical ray trace luster prediction computer model is used to explain the reduced dye yield of microdenier yams. Results from the model demonstrate that the reduced dye yield is a necessary consequence of the reduced path length of light inside the filaments. Data are shown for the predicted brightness of a set of standard denier per filament and microdenier PET (Micromattique(TM) yarns.

引用

页码：475 / 479

页数：5

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