EFFECTIVE CONDUCTIVITY AND MICROWAVE REFLECTIVITY OF THIN METALLIC-FILMS

被引：38

作者：

HANSEN, RC ^{[1
]}

PAWLEWICZ, WT ^{[1
]}

机构：

[1] BATTELLE MEM INST,PACIFIC NW LABS,RICHLAND,WA 99352

来源：

关键词：

D O I：

10.1109/TMTT.1982.1131380

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2064 / 2066

页数：3

共 10 条

[1]

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[2]

CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P299

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[4] ELECTROMAGNETIC SHIELDING WITH TRANSPARENT COATED GLASS [J].

HAWTHORNE, EI .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1954, 42 (03) :548-553

LIAO, SY .

[6]

LIAO SY, 1980, MICROWAVE DEVICES CI

[7] PROPERTIES OF THIN METAL FILMS AT MICROWAVE FREQUENCIES [J].

RAMEY, RL ;

LEWIS, TS .

[8]

Ramo S., 2008, FIELDS WAVES COMMUNI

[9] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

[10]

Zemel J. N., 1966, USE THIN FILMS PHYSI, P319