A SECONDARY LASER CAVITY SYSTEM FOR SPECTROPHOTOMETRY OF TRACE-ELEMENTS BASED ON INTRACAVITY QUENCHING AND THERMAL LENS EFFECTS

被引：9

作者：

GRISHKO, VI ^{[1
]}

YUDELEVICH, IG ^{[1
]}

GRISHKO, VP ^{[1
]}

机构：

[1] ACAD MED SCI USSR,INST INORGAN CHEM,NOVOSIBIRSK,USSR

来源：

ANALYTICA CHIMICA ACTA | 1984年 / 160卷 / JUN期

关键词：

D O I：

10.1016/S0003-2670(00)84517-1

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：159 / 170

页数：12

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