IMPROVED ALPHA-2 ELIMINATION

被引：75

作者：

DELHEZ, R ^{[1
]}

MITTEMEIJER, EJ ^{[1
]}

机构：

[1] DELFT UNIV TECHNOL,LAB MET,ROTTERDAMSEWEG 137,DELFT,NETHERLANDS

来源：

关键词：

D O I：

10.1107/S0021889875011466

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：609 / 611

页数：3

共 7 条

[1] Compton A.H., 1935, XRAYS THEORY EXPT
[2] PRACTICAL DETERMINATION OF LATTICE PARAMETERS USING CENTROID METHOD
DELF, BW
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (06): : 345 - &
[3] ANALYSIS OF ERRORS IN FOURIER COEFFICIENTS OF ALPHA-1 LINE-PROFILE
DELHEZ, R
MITTEMEIJER, EJ
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (DEC1) : 612 - 614
[4] DUMOND JW, 1931, PHYS REV, V37, P154
[5] SEPARATION OF ALPHA1-ALPHA2 DOUBLET IN X-RAY DIFFRACTION PROFILES
GANGULEE, A
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 : 272 - &
[6] A CORRECTION FOR THE ALPHA-1,ALPHA-2 DOUBLET IN THE MEASUREMENT OF WIDTHS OF X-RAY DIFFRACTION LINES
RACHINGER, WA
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07): : 254 - 255
[7] WAGNER CNJ, 1966, LOCAL ATOMIC ARRANGE, P234