GENERALIZED RAMSAUER-TOWNSEND EFFECT IN EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE

被引：34

作者：

MCKALE, AG ^{[1
]}

VEAL, BW ^{[1
]}

PAULIKAS, AP ^{[1
]}

CHAN, SK ^{[1
]}

机构：

[1] ARGONNE NATL LAB,ARGONNE,IL 60439

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.38.10919

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：10919 / 10921

页数：3

共 13 条

[1] GENERALIZED RAMSAUER-TOWNSEND RESONANCE IN ANGLE-RESOLVED PHOTOEMISSION EXTENDED FINE-STRUCTURE OSCILLATIONS [J].

BARTON, JJ ;

HUSSAIN, Z ;

SHIRLEY, DA .

PHYSICAL REVIEW B, 1987, 35 (03) :933-938

[2]

FLAXEN H, 1927, Z PHYS, V45, P307

[3]

HAYES JM, 1981, SOLID STATE PHYS, V37, P173

[4] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL [J].

LEE, PA ;

CITRIN, PH ;

EISENBERGER, P ;

KINCAID, BM .

REVIEWS OF MODERN PHYSICS, 1981, 53 (04) :769-806

[5] PRACTICAL METHOD FOR FULL CURVED-WAVE THEORY ANALYSIS OF EXPERIMENTAL EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE [J].

MCKALE, AG ;

KNAPP, GS ;

CHAN, SK .

PHYSICAL REVIEW B, 1986, 33 (02) :841-846

[6] IMPROVED ABINITIO CALCULATIONS OF AMPLITUDE AND PHASE FUNCTIONS FOR EXTENDED X-RAY ABSORPTION FINE-STRUCTURE SPECTROSCOPY [J].

MCKALE, AG ;

VEAL, BW ;

PAULIKAS, AP ;

CHAN, SK ;

KNAPP, GS .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1988, 110 (12) :3763-3768

[7] IMPROVED DETERMINATION OF BACKSCATTERING AMPLITUDE AND PHASE-SHIFT FUNCTIONS [J].

MCKALE, AG ;

CHAN, SK ;

VEAL, BW ;

PAULIKAS, AP ;

KNAPP, GS .

JOURNAL DE PHYSIQUE, 1986, 47 (C-8) :55-62

[8]

Ramsauer C, 1923, ANN PHYS-BERLIN, V72, P345

[9]

Ramsauer C, 1922, ANN PHYS-BERLIN, V66, P546

[10]

Ramsauer C, 1921, ANN PHYS-BERLIN, V64, P513

← 1 2 →