HIGH-VOLTAGE DAMAGE AND LOW-FREQUENCY NOISE IN THICK-FILM RESISTORS

被引：22

作者：

STEVENS, EH

GILBERT, DA

RINGO, JA

机构：

[1] UNIV IDAHO,DEPT ELECT ENGN,MOSCOW,ID 83843

[2] WASHINGTON STATE UNIV,DEPT ELECT ENGN,PULLMAN,WA 99163

来源：

IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING | 1976年 / 12卷 / 04期

关键词：

D O I：

10.1109/TPHP.1976.1135152

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：351 / 356

页数：6

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GILBERT DA, 1976, THESIS U IDAHO

[4]

Himmel R. P., 1971, Proceedings of the 21st electronic components conference, P504

[5] 1/F-NOISE IN CONTINUOUS THIN GOLD FILMS [J].

HOOGE, FN ;

HOPPENBROUWERS, AM .

PHYSICA, 1969, 45 (03) :386-+

[6] 1/F NOISE IS NO SURFACE EFFECT [J].

HOOGE, FN .

[7]

KUO CY, 1968, P ISHM C US, P153

[8]

OLIVEI A, 1973, P EL COMP C ECC IEEE, P140

[9]

POLINSKI PW, 1973, SOLID STATE TECH MAY, P31

[10]

RAO BVJ, 1975, P INT MICROELECTRONI, P201