共 15 条
[1]
DEGRANDPRE M, 1988, SPIE, V923, P158
[2]
OVERLAY ACCURACY EVALUATION IN STEP-AND-REPEAT X-RAY-LITHOGRAPHY
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
1988, 27 (07)
:1275-1280
[4]
HOSOKAWA T, IN PRESS REV SCI INS
[5]
ISHIHARA S, 1989, 33RD EIPB, pG4
[6]
A NOVEL HIGH-SPEED NANOMETRIC ELECTRON-BEAM LITHOGRAPHY SYSTEM - EB-F
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1987, 5 (01)
:75-78
[7]
Kobayashi T., 1988, International Electron Devices Meeting. Technical Digest (IEEE Cat. No.88CH2528-8), P881, DOI 10.1109/IEDM.1988.32951
[8]
OHKI S, UNPUB J VAC SCI TECH
[9]
OHKI S, 1987, SPR JSAP RS, P400
[10]
SEKIMOTO M, 1984, 16TH INT C SOL STAT, P23