IONIZATION, ELECTRODE SURFACES AND DISCHARGES IN SF6 AT EXTRA-HIGH-VOLTAGES

被引：27

作者：

COOKE, CM ^{[1
]}

机构：

[1] MIT,HIGH VOLTAGE RES LAB,CAMBRIDGE,MA 02139

来源：

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1975年 / 94卷 / 05期

关键词：

D O I：

10.1109/T-PAS.1975.31994

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1518 / 1523

页数：6

共 15 条

[1] MEASUREMENT OF IONIZATION AND ATTACHMENT COEFFICIENTS IN SULPHUR HEXAFLUORIDE IN UNIFORM FIELDS [J].

BHALLA, MS ;

CRAGGS, JD .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1962, 80 (513) :151-&

[2] ELECTRICAL BREAKDOWN AND SIMILARITY LAW IN SF6 AT EXTRA-HIGH-VOLTAGES [J].

BORTNIK, IM ;

COOKE, CM .

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1972, 91 (05) :2196-&

[3]

BORTNIK IM, 1971, SOVIET PHYS TECH PHY, V16

[4] MEASUREMENT OF IONIZATION AND ATTACHMENT COEFFICIENTS IN SF6 [J].

BOYD, HA ;

CRICHTON, GC .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1971, 118 (12) :1872-&

[5] ELECTRICAL BREAKDOWN FOR UNIFORM FIELDS IN COMPRESSED GASES [J].

COOKSON, AH .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1970, 117 (01) :269-+

[6] COMPUTER SIMULATION OF RAPIDLY DEVELOPING GASEOUS DISCHARGES [J].

DAVIES, AJ ;

DAVIES, CS ;

EVANS, CJ .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1971, 118 (06) :816-&

[7] INHERENT LIMITATIONS IN UNIFORM FIELD DISCHARGE DATA FOR SF6 [J].

KARLSSON, PW ;

PEDERSEN, A .

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1972, PA91 (04) :1597-+

[8]

LARUE WD, 1880, PHIL T ROY SOC LONDO, V171, P65

[9]

LEBEDEV NN, 1962, ZH TEKHNICHESKOI FES, V32, P375

[10] AREA EFFECT OF ELECTRICAL BREAKDOWN IN COMPRESSED SF6 [J].

NITTA, T ;

YAMADA, N ;

FUJIWARA, Y .

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1974, PA93 (02) :623-629

← 1 2 →