DRIFT MOBILITY, ELECTRON TRAPPING, AND DIFFUSION-LIMITED KINETICS IN SULFUR-SENSITIZED AGBR MICROCRYSTALS

被引:39
作者
DERI, RJ
SPOONHOWER, JP
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D O I
10.1063/1.335425
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O59 [应用物理学];
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页码:2806 / 2811
页数:6
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共 26 条
[1]   STUDIES OF POLARON MOBILITY IN AGBR AT HIGH TEMPERATURES [J].
AHRENKIEL, RK .
PHYSICAL REVIEW, 1969, 180 (03) :859-+
[2]  
ARDASHEV IV, 1973, PHOTOGR SCI ENG, V17, P348
[3]  
BLENKINSOP ID, 1977, ELECTRON LETT, V13, P14, DOI 10.1049/el:19770011
[4]  
BROWN FC, 1976, TREATISE SOLID STATE, V7
[5]   ELECTRON MOBILITY AND SCATTERING PROCESSES IN AGBR AT LOW TEMPERATURES [J].
BURNHAM, DC ;
BROWN, FC ;
KNOX, RS .
PHYSICAL REVIEW, 1960, 119 (05) :1560-1570
[6]   CROSS-SECTION FOR PHOTOELECTRON CAPTURE BY IRBR6(3-) IN AGBR [J].
DERI, RJ ;
SPOONHOWER, JP .
APPLIED PHYSICS LETTERS, 1983, 43 (01) :65-67
[7]  
DERI RJ, 1984, PHOTOGR SCI ENG, V28, P92
[8]   MECHANISM OF SULFUR SENSITIZATION [J].
FATUZZO, E ;
COPPO, S .
JOURNAL OF PHOTOGRAPHIC SCIENCE, 1972, 20 (02) :43-&
[9]   ROLE OF MOBILE SILVER IONS IN LATENT-IMAGE FORMATION [J].
HAMILTON, JF ;
BRADY, LE .
JOURNAL OF PHYSICAL CHEMISTRY, 1962, 66 (12) :2384-&
[10]  
HAMILTON JF, 1983, PHOTOGR SCI ENG, V27, P225