共 6 条
[1]
PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 116 (03)
:487-499
[2]
Friedel G, 1913, CR HEBD ACAD SCI, V157, P1533
[3]
HAAN G, 1972, EXPER TECH PHYS, V20, P67
[4]
KOSSEL W, 1937, ERG EXAKT NATURWISS, V16, P295
[6]
VONLAUE M, 1941, RONTGENSTRAHLINTERFE