PRACTICAL COMPUTATION OF AMPLITUDES AND PHASES IN ELECTRON-DIFFRACTION

被引：107

作者：

SELF, PG

OKEEFE, MA

BUSECK, PR

SPARGO, AEC

机构：

[1] UNIV CAMBRIDGE,DEPT MET,CAMBRIDGE CB2 3QZ,ENGLAND

[2] UNIV CAMBRIDGE,HREM,CAMBRIDGE CB2 3RQ,ENGLAND

[3] ARIZONA STATE UNIV,DEPT CHEM,TEMPE,AZ 85287

[4] UNIV MELBOURNE,DEPT PHYS,PARKVILLE,VIC 3054,AUSTRALIA

来源：

ULTRAMICROSCOPY | 1983年 / 11卷 / 01期

关键词：

D O I：

10.1016/0304-3991(83)90053-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：35 / 52

页数：18

共 54 条

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