A SIMPLE PROCEDURE FOR EVALUATING EFFECTIVE SCATTERING CROSS-SECTIONS IN STEM

被引：22

作者：

KOHL, H

机构：

[1] Technische Hochschule Darmstadt,, Inst fuer Angewandte Physik,, Darmstadt, West Ger, Technische Hochschule Darmstadt, Inst fuer Angewandte Physik, Darmstadt, West Ger

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 02期

关键词：

D O I：

10.1016/0304-3991(85)90081-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

MICROSCOPES, ELECTRON

引用

页码：265 / 268

页数：4

共 20 条

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[2]

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[3]

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[4]

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[5] K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].

EGERTON, RF .

ULTRAMICROSCOPY, 1979, 4 (02) :169-179

[6]

EGERTON RF, 1981, 39TH P ANN EMSA M AT, P198

[7] ELECTRON-SCATTERING IN ICE AND ORGANIC MATERIALS [J].

EUSEMANN, R ;

ROSE, H ;

DUBOCHET, J .

JOURNAL OF MICROSCOPY-OXFORD, 1982, 128 (DEC) :239-249

[8]

EUSEMANN R, 1984, THESIS TH DARMSTADT

[9]

FLUGGE S, 1952, RECHENMETHODEN QUANT, P262

[10]

ISAACSON M, 1978, SCANNING ELECTRON MI, V1, P763

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