INTERCOMPARISON BETWEEN SILICON AND BLACKBODY-BASED RADIOMETRY USING A SILICON PHOTODIODE FILTER RADIOMETER

被引:8
作者
SCHAEFER, AR
SAUNDERS, RD
机构
来源
APPLIED OPTICS | 1984年 / 23卷 / 14期
关键词
D O I
10.1364/AO.23.002224
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2224 / 2226
页数:3
相关论文
共 12 条
[1]   CALIBRATION OF INCANDESCENT LAMPS FOR SPECTRAL IRRADIANCE BY MEANS OF ABSOLUTE RADIOMETERS [J].
BOIVIN, LP .
APPLIED OPTICS, 1980, 19 (16) :2771-2780
[2]   CIE INTERLABORATORY COMPARISON OF MEASUREMENTS OF PHOTOCELL SPECTRAL SENSITIVITY [J].
BUDDE, W ;
SANDERS, CL .
APPLIED OPTICS, 1973, 12 (09) :2099-2107
[3]   ABSOLUTE SPECTRORADIOMETRIC AND PHOTOMETRIC SCALES BASED ON AN ELECTRICALLY CALIBRATED PYROELECTRIC RADIOMETER [J].
CARRERAS, C ;
CORRONS, A .
APPLIED OPTICS, 1981, 20 (07) :1174-1177
[4]   COMPLETE COLLECTION OF MINORITY-CARRIERS FROM THE INVERSION LAYER IN INDUCED JUNCTION DIODES [J].
GEIST, J ;
LIANG, E ;
SCHAEFER, AR .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (07) :4879-4881
[5]   ELECTRICALLY BASED SPECTRAL POWER MEASUREMENTS THROUGH USE OF A TUNABLE CW LASER [J].
GEIST, J ;
STEINER, B ;
SCHAEFER, R ;
ZALEWSKI, E ;
CORRONS, A .
APPLIED PHYSICS LETTERS, 1975, 26 (06) :309-311
[6]  
GEIST J, 1977, NBS954 US TECH NOT
[7]  
SAUNDERS RD, 1977, NBS59413 US TECH NOT
[8]   SPECTROPHOTOMETRIC TESTS USING A DYE-LASER-BASED RADIOMETRIC CHARACTERIZATION FACILITY [J].
SCHAEFER, AR ;
ECKERLE, KL .
APPLIED OPTICS, 1984, 23 (02) :250-256
[9]   SILICON PHOTO-DIODE DEVICE WITH 100-PERCENT EXTERNAL QUANTUM EFFICIENCY [J].
ZALEWSKI, EF ;
DUDA, CR .
APPLIED OPTICS, 1983, 22 (18) :2867-2873
[10]   SILICON PHOTO-DIODE ABSOLUTE SPECTRAL RESPONSE SELF-CALIBRATION [J].
ZALEWSKI, EF ;
GEIST, J .
APPLIED OPTICS, 1980, 19 (08) :1214-1216