AN ELECTROCHEMICAL AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE PASSIVE STATE OF CHROMIUM

被引:160
作者
MOFFAT, TP [1 ]
LATANISION, RM [1 ]
机构
[1] MIT, HH UHLIG CORROS LAB, CAMBRIDGE, MA 02139 USA
关键词
D O I
10.1149/1.2069514
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The passive state of chromium has been examined in 1M H2SO4 by a variety of electrochemical techniques and x-ray photoelectron spectroscopy. The potentiodynamic behavior of the passive electrode may be described by high-field film growth kinetics. The passivating oxide film is 5-25 angstrom thick and consists of chromic ions bridged together by a network of water, hydroxide, and oxide ligands. The film thickness is a linear function of potential while the electrode capacitance is inversely proportional to the applied potential. Thus, the passive film behaves as a simple dielectric with a dielectric constant of approximately 25 and an ionic resistivity of approximately 10(13) OMEGA-cm. The distribution of potential across the electrode is consistent with the kinetics of film growth and dissolution. The onset of transpassivity is revealed by a distinct transition in the capacitance-potential characteristic of the electrode. Cyclic voltammetry demonstrates that this transition is associated with the presence of higher valent chromium species in the film.
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页码:1869 / 1879
页数:11
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