HYDROGENATION OF GAAS ON SI - EFFECTS ON DIODE REVERSE LEAKAGE CURRENT

被引:45
作者
PEARTON, SJ [1 ]
WU, CS [1 ]
STAVOLA, M [1 ]
REN, F [1 ]
LOPATA, J [1 ]
DAUTREMONTSMITH, WC [1 ]
VERNON, SM [1 ]
HAVEN, VE [1 ]
机构
[1] SPIRE CORP, BEDFORD, MA 01730 USA
关键词
D O I
10.1063/1.98378
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:496 / 498
页数:3
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共 18 条
[11]   NITRIDIZATION OF GALLIUM-ARSENIDE SURFACES - EFFECTS ON DIODE LEAKAGE CURRENTS [J].
PEARTON, SJ ;
HALLER, EE ;
ELLIOT, AG .
APPLIED PHYSICS LETTERS, 1984, 44 (07) :684-686
[12]  
PEARTON SJ, UNPUB
[13]  
PEARTON SJ, 1985, J ELECTRON MATER A, V14, P737
[14]   SELECTIVE PATTERNING OF SINGLE-CRYSTAL GAAS/GE STRUCTURES ON SI SUBSTRATES BY MOLECULAR-BEAM EPITAXY [J].
SHELDON, P ;
DICK, JR ;
HAYES, RE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1985, 3 (03) :883-886
[15]   ACTIVATION CHARACTERISTICS AND DEFECT STRUCTURE IN SI-IMPLANTED GAAS-ON-SI [J].
VERNON, SM ;
PEARTON, SJ ;
GIBSON, JM ;
SHORT, KT ;
HAVEN, VE .
APPLIED PHYSICS LETTERS, 1987, 50 (17) :1161-1163
[16]   ALGAAS DOUBLE-HETEROSTRUCTURE DIODE-LASERS FABRICATED ON A MONOLITHIC GAAS/SI SUBSTRATE [J].
WINDHORN, TH ;
METZE, GM ;
TSAUR, BY ;
FAN, JCC .
APPLIED PHYSICS LETTERS, 1984, 45 (04) :309-311
[17]   ARE THEY REALLY SCHOTTKY BARRIERS AFTER ALL [J].
WOODALL, JM ;
FREEOUF, JL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02) :574-576
[18]  
1986, P MATER RES SOC S, V67, pR17