CHARACTERIZATION AND MICROWAVE PROPERTIES OF ELECTRON-BEAM DEPOSITED BSCCO FILMS

被引:6
作者
ANDREONE, A [1 ]
ATTANASIO, C [1 ]
DICHIARA, A [1 ]
MARITATO, L [1 ]
NIGRO, A [1 ]
PELUSO, G [1 ]
VAGLIO, R [1 ]
机构
[1] UNIV SALERNO,DIPARTMENTO FIS,I-84100 SALERNO,ITALY
来源
PHYSICA C | 1991年 / 180卷 / 1-4期
关键词
D O I
10.1016/0921-4534(91)90679-S
中图分类号
O59 [应用物理学];
学科分类号
摘要
Bi2Sr2CaCu2Ox thin films have been obtained on MgO and sapphire substrates by complete electron-beam evaporation of a bulk pellet and subsequent ex-situ oxigen annealing. Careful control of the initial stoichiometry and of the annealing procedure allowed to obtain high quality films with T(co) = 85 K. The films were polycrystalline but highly textured with the c-axis perpendicular to the substrate plane and critical current density of 5.10(4) A/cm2. In order to test the microwave properties of the films an innovative method, based on the measure of the quality factor of a ring microstrip resonator, has been set up. Preliminary measurments of the surface impedance versus rf power of BSCCO films on MgO substrate are presented.
引用
收藏
页码:272 / 275
页数:4
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