SPREADING RESISTANCE PROBE-SPACING EXPERIMENT SIMULATIONS - EFFECTS OF PROBE-CURRENT DENSITY AND LAYER THICKNESS

被引：1

作者：

ALBERS, J

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1982年 / 129卷 / 12期

关键词：

D O I：

10.1149/1.2123680

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：2788 / 2795

页数：8

共 10 条

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[6]

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[8] SPREADING RESISTANCE CALCULATIONS FOR GRADED STRUCTURES BASED ON UNIFORM FLUX SOURCE BOUNDARY-CONDITION [J].

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[9] APPLICATION OF MULTILAYER POTENTIAL DISTRIBUTION TO SPREADING RESISTANCE CORRECTION FACTORS [J].

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[10]

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