X-ray diffraction characterization of defect behavior in nanocrystalline nickel during annealing

被引：19

作者：

Eastman, JA

Beno, MA

Knapp, GS

Thompson, LJ

机构：

[1] Argonne National Laboratory, Materials Science Division, Argonne, IL

来源：

NANOSTRUCTURED MATERIALS | 1995年 / 6卷 / 5-8期

关键词：

Annealing - Characterization - Correlation methods - Crystal defects - Grain growth - Grain size and shape - Nickel - Strain - X ray diffraction;

D O I：

10.1016/0965-9773(95)00116-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Nanocrystalline nickel samples were annealed while collecting high angle Xray diffraction data in order to correlate changes in strain and defect content with changes in grain size. The microstrain broadening magnitude decreased rapidly prior to any grain growth, while the Debye-Waller parameter was not reduced significantly prior to the onset of grain growth.

引用

页码：543 / 546

页数：4

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