SIMULTANEOUS MEASUREMENT OF THE 2-PHOTON COEFFICIENT AND FREE-CARRIER CROSS-SECTION ABOVE THE BANDGAP OF CRYSTALLINE SILICON

被引：164

作者：

BOGGESS, TF ^{[1
]}

BOHNERT, KM ^{[1
]}

MANSOUR, K ^{[1
]}

MOSS, SC ^{[1
]}

BOYD, IW ^{[1
]}

SMIRL, AL ^{[1
]}

机构：

[1] HUGHES RES LABS,MALIBU,CA 90265

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1986年 / 22卷 / 02期

关键词：

D O I：

10.1109/JQE.1986.1072964

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：360 / 368

页数：9

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