INFLUENCE OF ENERGY SPREAD OF FIELD-EMITTED ELECTRONS ON RESOLUTION IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE (STEM)

被引：7

作者：

BAUER, B ^{[1
]}

SPEIDEL, R ^{[1
]}

机构：

[1] UNIV TUBINGEN,INST ANGEW PHYS,D-7400 TUBINGEN 1,FED REP GER

来源：

关键词：

D O I：

10.1016/S0304-3991(81)80163-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：281 / 286

页数：6

共 10 条

[1] BAUER B, 1977, OPTIK, V48, P237
[2] A FIELD EMISSION STUDY OF OXYGEN ADSORPTION ON (110) (211) (111) AND (100) PLANES OF TUNGSTEN
BELL, AE
SWANSON, LW
CROUSER, LC
[J]. SURFACE SCIENCE, 1968, 10 (02) : 254 - &
[3] ELECTRON GUN USING A FIELD EMISSION SOURCE
CREWE, AV
EGGENBER.DN
WALL, J
WELTER, LM
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 576 - &
[4] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE
CREWE, AV
WALL, J
WELTER, LM
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) : 5861 - &
[5] KERN D, 1978, OPTIK, V52, P61
[6] MUNRO E, 1972, 5TH P EUR C EL MICR, P22
[7] SOKOLOVSKAIA IL, 1956, SOV PHYS TECHN PHYS, V26, P1147
[8] SPEIDEL R, 1979, OPTIK, V54, P257
[9] SPEIDEL R, 1977, OPTIK, V49, P173
[10] OXYGEN-PROCESSED FIELD-EMISSION SOURCE
VENEKLAS.LH
SIEGEL, BM
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 1600 - &