STUDY ON GROWTH OF THIN-LAYERS USING OPTICAL AND ELECTRICAL MEASUREMENTS DURING THEIR DEPOSITION

被引：11

作者：

GADENNE, P ^{[1
]}

机构：

[1] UNIV PARIS 06, OPT SOLIDES LAB, CNRS, EQUIPE RECH, F-75230 PARIS 05, FRANCE

来源：

THIN SOLID FILMS | 1977年 / 42卷 / 03期

关键词：

D O I：

10.1016/0040-6090(77)90372-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：369 / 381

页数：13

共 30 条

[1]

ABELES F, 1967, ADV OPTICAL TECHNIQU, P145

[2] DESIGN OF A NEW VACUUM DEPOSITION SPECIMEN HOLDER FOR AN ELECTRON MICROSCOPE OPERATING AT 10-8 TORR [J].

BARNA, A ;

BARNA, PB ;

POCZA, JF .

VACUUM, 1967, 17 (04) :219-&

[3] VARIATIONS AVEC LA TEMPERATURE DE LA RESISTIVITE DES COUCHES MINCES DOR [J].

BROQUET, P ;

VAN, VN .

SURFACE SCIENCE, 1967, 6 (01) :98-&

[4]

BROQUET P, 1970, J PHYS PARIS C, V1, P79

[5] OPTICAL PROPERTIES OF GRANULAR SILVER AND GOLD FILMS [J].

COHEN, RW ;

CODY, GD ;

COUTTS, MD ;

ABELES, B .

PHYSICAL REVIEW B, 1973, 8 (08) :3689-3701

[6]

DEVANT G, 1969, THESIS ORSAY

[7] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[8]

GADENNE P, TO BE PUBLISHED

[9] OPTICAL EVIDENCE FOR A NETWORK OF CRACKLIKE VOIDS IN AMORPHOUS GERMANIUM [J].

GALEENER, FL .

PHYSICAL REVIEW LETTERS, 1971, 27 (25) :1716-&

[10] SUBMICROSCOPIC-VOID RESONANCE - EFFECT OF INTERNAL ROUGHNESS ON OPTICAL ABSORPTION [J].

GALEENER, FL .

PHYSICAL REVIEW LETTERS, 1971, 27 (07) :421-&

← 1 2 3 →